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IEICE Trans

Toshio IKEDA

Technique to Diagnose Open Defects that Takes Coupling Effects into Consideration
Yasuo SATO Iwao YAMAZAKI Hiroki YAMANAKA Toshio IKEDA Masahiro TAKAKURA Kazuhiko IWASAKI 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 2004/09/01
Vol. E87-D  No. 9  pp. 2179-2185
Type of Manuscript:  PAPER
Category: Dependable Computing
Keyword: 
diagnosis, open fault, coupling effect, 
 Summary | Full Text:PDF