Keyword : open fault

Layout-Aware Fast Bridge/Open Test Generation by 2-Step Pattern Reordering
Masayuki ARAI Shingo INUYAMA Kazuhiko IWASAKI 
Publication:   
Publication Date: 2018/12/01
Vol. E101-A  No. 12 ; pp. 2262-2270
Type of Manuscript:  Special Section PAPER (Special Section on VLSI Design and CAD Algorithms)
Category: 
Keyword: 
weighted fault coverage, critical area, critical area analysis, bridge fault, open fault, 
 Summary | Full Text:PDF
Reordering-Based Test Pattern Reduction Considering Critical Area-Aware Weighted Fault Coverage
Masayuki ARAI Kazuhiko IWASAKI 
Publication:   
Publication Date: 2017/07/01
Vol. E100-A  No. 7 ; pp. 1488-1495
Type of Manuscript:  Special Section PAPER (Special Section on Design Methodologies for System on a Chip)
Category: 
Keyword: 
weighted fault coverage, critical area, test cost reduction, test pattern reduction, bridge fault, open fault, 
 Summary | Full Text:PDF
A Method of Locating Open Faults on Incompletely Identified Pass/Fail Information
Koji YAMAZAKI Yuzo TAKAMATSU 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 2008/03/01
Vol. E91-D  No. 3 ; pp. 661-666
Type of Manuscript:  Special Section PAPER (Special Section on Test and Verification of VLSIs)
Category: Fault Diagnosis
Keyword: 
fault diagnosis, open fault, BIST, pass/fail information, 
 Summary | Full Text:PDF
Technique to Diagnose Open Defects that Takes Coupling Effects into Consideration
Yasuo SATO Iwao YAMAZAKI Hiroki YAMANAKA Toshio IKEDA Masahiro TAKAKURA Kazuhiko IWASAKI 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 2004/09/01
Vol. E87-D  No. 9 ; pp. 2179-2185
Type of Manuscript:  PAPER
Category: Dependable Computing
Keyword: 
diagnosis, open fault, coupling effect, 
 Summary | Full Text:PDF