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IEICE Trans

Tjerk G. SPANJER

The Effect of Focus Voltage and Beam Repulsion on the Microscopic Electron Spot Shape
A.A. Seyno SLUYTERMAN Tjerk G. SPANJER 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2003/11/01
Vol. E86-C  No. 11  pp. 2264-2268
Type of Manuscript:  Special Section PAPER (Special Issue on Electronic Displays)
Category: CRT Technology
Keyword: 
cathode-ray tube, electron gun, shadow mask, microscopic spot-size, space charge, 
 Summary | Full Text:PDF