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The Effect of Focus Voltage and Beam Repulsion on the Microscopic Electron Spot Shape
A.A. Seyno SLUYTERMAN Tjerk G. SPANJER
IEICE TRANSACTIONS on Electronics
Publication Date: 2003/11/01
Print ISSN: 0916-8516
Type of Manuscript: Special Section PAPER (Special Issue on Electronic Displays)
Category: CRT Technology
cathode-ray tube, electron gun, shadow mask, microscopic spot-size, space charge,
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The size of the microscopic electron spot is an important parameter for the white-uniformity of a CRT. It changes as a function of the focus voltage and beam repulsion. This paper explains the mechanism behind this phenomenon. The model is supported by means of measurements.