The Effect of Focus Voltage and Beam Repulsion on the Microscopic Electron Spot Shape

A.A. Seyno SLUYTERMAN  Tjerk G. SPANJER  

Publication
IEICE TRANSACTIONS on Electronics   Vol.E86-C   No.11   pp.2264-2268
Publication Date: 2003/11/01
Online ISSN: 
DOI: 
Print ISSN: 0916-8516
Type of Manuscript: Special Section PAPER (Special Issue on Electronic Displays)
Category: CRT Technology
Keyword: 
cathode-ray tube,  electron gun,  shadow mask,  microscopic spot-size,  space charge,  

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Summary: 
The size of the microscopic electron spot is an important parameter for the white-uniformity of a CRT. It changes as a function of the focus voltage and beam repulsion. This paper explains the mechanism behind this phenomenon. The model is supported by means of measurements.