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IEICE Trans

Thye-Lai TUNG

Numerical Techniques on Enhancing Robustness for Stress-Dependent Oxidation Simulation Using Finite Element Method in SUPREM-IV
Yoshinori ODA Kaung-Shia YU Thye-Lai TUNG Arthur RAEFSKY Donald L. SCHARFETTER Robert W. DUTTON 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 1992/02/25
Vol. E75-C  No. 2  pp. 150-155
Type of Manuscript:  Special Section PAPER (Special Issue on Selected Papers from '91 VPAD)
Category: 
Keyword: 
simulation, oxidation, finite element method, stress, 
 Summary | Full Text:PDF