Keyword : stress


Post-Packaging Simulation Based on MOSFET Characteristics Variations Due to Resin-Molded Encapsulation
Naohiro UEDA Hirobumi WATANABE 
Publication:   
Publication Date: 2020/06/01
Vol. E103-C  No. 6 ; pp. 317-323
Type of Manuscript:  PAPER
Category: Ultrasonic Electronics
Keyword: 
stresspiezoelectricpackagesimulationSPICE
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Exhaustive and Systematic Accuracy Verification and Enhancement of STI Stress Compact Model for General Realistic Layout Patterns
Kenta YAMADA Toshiyuki SYO Hisao YOSHIMURA Masaru ITO Tatsuya KUNIKIYO Toshiki KANAMOTO Shigetaka KUMASHIRO 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2010/08/01
Vol. E93-C  No. 8 ; pp. 1349-1358
Type of Manuscript:  PAPER
Category: Semiconductor Materials and Devices
Keyword: 
STIstressmodelverificationenhancement
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Layout-Aware Compact Model of MOSFET Characteristics Variations Induced by STI Stress
Kenta YAMADA Takashi SATO Shuhei AMAKAWA Noriaki NAKAYAMA Kazuya MASU Shigetaka KUMASHIRO 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2008/07/01
Vol. E91-C  No. 7 ; pp. 1142-1150
Type of Manuscript:  PAPER
Category: Semiconductor Materials and Devices
Keyword: 
STIstressmodelingSPICElayout-aware
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A 600-700 GHz Resonant Distributed Junction for a Fixed-Tuned Waveguide Receiver
Teruhiko MATSUNAGA Cheuk-yu Edward TONG Raymond BLUNDELL Takashi NOGUCHI 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2002/03/01
Vol. E85-C  No. 3 ; pp. 738-741
Type of Manuscript:  Special Section PAPER (Special Issue on Superconductive Electronics)
Category: Mixers and Detectors
Keyword: 
SIS transmission lineresonatoroptical lithographystressreceiver noise temperature
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The Influence of Stud Bumping above the MOSFETs on Device Reliability
Nobuhiro SHIMOYAMA Katsuyuki MACHIDA Masakazu SHIMAYA Hideo AKIYA Hakaru KYURAGI 
Publication:   IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences
Publication Date: 2000/05/25
Vol. E83-A  No. 5 ; pp. 851-856
Type of Manuscript:  Special Section PAPER (Special Section on Reliability Theory and Its Applications)
Category: 
Keyword: 
stud bumpstressinterface trapshot carrierannealing
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Study of LOCOS-Induced Anomalous Leakage Current in Thin Film SOI MOSFET's
Shigeru KAWANAKA Shinji ONGA Takako OKADA Michihiro OOSE Toshihiko IINUMA Tomoaki SHINO Takashi YAMADA Makoto YOSHIMI Shigeyoshi WATANABE 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 1999/07/25
Vol. E82-C  No. 7 ; pp. 1341-1346
Type of Manuscript:  PAPER
Category: Semiconductor Materials and Devices
Keyword: 
SOILOCOS isolationcrystal defectleakage currentstress
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A Bipolar-Based 0.5 µm BiCMOS Technology on Bonded SOI for High-Speed LSIs
Makoto YOSHIDA Toshiro HIRAMOTO Tsuyoshi FUJIWARA Takashi HASHIMOTO Tetsuya MURAYA Shigeharu MURATA Kunihiko WATANABE Nobuo TAMBA Takahide IKEDA 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 1994/08/25
Vol. E77-C  No. 8 ; pp. 1395-1403
Type of Manuscript:  Special Section PAPER (Special Section on High Speed and High Density Multi Functional LSI Memories)
Category: General Technology
Keyword: 
BiCMOSbonded SOIdouble polysilicon bipolartrench isolationstress
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Effects of the Gate Polycrystalline Silicon Film on the Characteristics of MOS Capacitor
Makoto AKIZUKI Masaki HIRASE Atsushi SAITA Hiroyuki AOE Atsumasa DOI 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 1992/09/25
Vol. E75-C  No. 9 ; pp. 1007-1012
Type of Manuscript:  Special Section PAPER (Special Issue on Silicon Devices and Materials)
Category: 
Keyword: 
MOS capacitorspolycystalline siliconamorphous siliconstressin-situ dopinggate oxideconstant current stressdielectric breakdowntrapped charge
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Numerical Techniques on Enhancing Robustness for Stress-Dependent Oxidation Simulation Using Finite Element Method in SUPREM-IV
Yoshinori ODA Kaung-Shia YU Thye-Lai TUNG Arthur RAEFSKY Donald L. SCHARFETTER Robert W. DUTTON 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 1992/02/25
Vol. E75-C  No. 2 ; pp. 150-155
Type of Manuscript:  Special Section PAPER (Special Issue on Selected Papers from '91 VPAD)
Category: 
Keyword: 
simulationoxidationfinite element methodstress
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