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IEICE Trans

Terumine HAYASHI

An Iterative Improvement Method for Generating Compact Tests for IDDQ Testing of Bridging Faults
Tsuyoshi SHINOGI Terumine HAYASHI 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 1998/07/25
Vol. E81-D  No. 7  pp. 682-688
Type of Manuscript:  Special Section PAPER (Special Issue on Test and Diagnosis of VLSI)
Category: IDDQ Testing
Keyword: 
compaction, IDDQ testing, iterative improvement method, bridging fault, ATPG, 
 Summary | Full Text:PDF