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IEICE Trans

Tatsuro KOJO

A Relaxed Bit-Write-Reducing and Error-Correcting Code for Non-Volatile Memories Tatsuro KOJO Masashi TAWADA Masao YANAGISAWA Nozomu TOGAWA
Publication: IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences Publication Date: 2018/07/01 Vol. E101-A No. 7 pp. 1045-1052 Type of Manuscript: Special Section LETTER (Special Section on Design Methodologies for System on a Chip) Category: Keyword: non-volatile memory, bit-write-reducing, error-correcting codes, clustering conditions, S-bit flip conditions, S-bound graph, cluster graph, relaxed REC code,
	Summary \| Full Text:PDF

A Bit-Write-Reducing and Error-Correcting Code Generation Method by Clustering ECC Codewords for Non-Volatile Memories Tatsuro KOJO Masashi TAWADA Masao YANAGISAWA Nozomu TOGAWA
Publication: IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences Publication Date: 2016/12/01 Vol. E99-A No. 12 pp. 2398-2411 Type of Manuscript: Special Section PAPER (Special Section on VLSI Design and CAD Algorithms) Category: Keyword: non-volatile memory, bit-write-reducing, error-correcting codes, clustering conditions, S-bit flip conditions, S-bound graph, cluster graph, REC code,
	Summary \| Full Text:PDF

Code Generation Limiting Maximum and Minimum Hamming Distances for Non-Volatile Memories Tatsuro KOJO Masashi TAWADA Masao YANAGISAWA Nozomu TOGAWA
Publication: IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences Publication Date: 2015/12/01 Vol. E98-A No. 12 pp. 2484-2493 Type of Manuscript: Special Section PAPER (Special Section on VLSI Design and CAD Algorithms) Category: High-Level Synthesis and System-Level Design Keyword: non-volatile memory, maximum-writing bits, error-correcting codes, Doughnut code, code expansion,
	Summary \| Full Text:PDF