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IEICE Trans

Takemi UEKI

Evaluation of Soft-Error Immunity for 1-V CMOS Memory Cells with MTCMOS Technology
Takakuni DOUSEKI Shin'ichiro MUTOH Takemi UEKI Junzo YAMADA 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 1996/02/25
Vol. E79-C  No. 2  pp. 179-184
Type of Manuscript:  Special Section PAPER (Special Issue on Microelectronic Test Structures)
Category: Device and Circuit Characterization
Keyword: 
soft-error, 1-volt, multi-threshold, CMOS, memory, 
 Summary | Full Text:PDF