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Hypersphere Sampling for Accelerating High-Dimension and Low-Failure Probability Circuit-Yield Analysis
Shiho HAGIWARA Takanori DATE Kazuya MASU Takashi SATO | Publication: IEICE TRANSACTIONS on Electronics
Publication Date: 2014/04/01
Vol. E97-C
No. 4
pp. 280-288
Type of Manuscript:
Special Section PAPER (Special Section on Solid-State Circuit Design,---,Architecture, Circuit, Device and Design Methodology)
Category:
Keyword:
design for manufacturing, Monte Carlo method, importance sampling, SRAM, process variation, yield, norm minimization, Gaussian mixture models, clustering, hypersphere sampling, | | | Summary | Full Text:PDF | |
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