Takanori DATE

Hypersphere Sampling for Accelerating High-Dimension and Low-Failure Probability Circuit-Yield Analysis
Shiho HAGIWARA Takanori DATE Kazuya MASU Takashi SATO 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2014/04/01
Vol. E97-C  No. 4  pp. 280-288
Type of Manuscript:  Special Section PAPER (Special Section on Solid-State Circuit Design,---,Architecture, Circuit, Device and Design Methodology)
design for manufacturingMonte Carlo methodimportance samplingSRAMprocess variationyieldnorm minimizationGaussian mixture modelsclusteringhypersphere sampling
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