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IEICE Trans

Takaki YOSHIDA

A New Solution to Power Supply Voltage Drop Problems in Scan Testing
Takaki YOSHIDA Masafumi WATARI 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 2004/03/01
Vol. E87-D  No. 3  pp. 580-585
Type of Manuscript:  Special Section PAPER (Special Section on Test and Verification of VLSI)
Category: Scan Testing
Keyword: 
power supply voltage drop, noise, low power, scan test, clock duty, 
 Summary | Full Text:PDF