Keyword : clock duty

A New Solution to Power Supply Voltage Drop Problems in Scan Testing
Takaki YOSHIDA Masafumi WATARI 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 2004/03/01
Vol. E87-D  No. 3 ; pp. 580-585
Type of Manuscript:  Special Section PAPER (Special Section on Test and Verification of VLSI)
Category: Scan Testing
power supply voltage dropnoiselow powerscan testclock duty
 Summary | Full Text:PDF