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IEICE Trans

Soichi NADAHARA

Nanoscale Investigation of Piezo and Leakage Defects in SBT Film by SPM
Mami SAITO Kumi OKUWADA Soichi NADAHARA 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2001/06/01
Vol. E84-C  No. 6  pp. 802-807
Type of Manuscript:  Special Section PAPER (Special Issue on Nonvolatile Memories)
Category: FeRAMs
Keyword: 
AFM, piezo image, leakage current image, SrBi2Ta2O9, sol-gel method, 
 Summary | Full Text:PDF