IEICE Trans

Keyword : AFM

High-Sensitive Detection of Electronic Emission through Si-Nanocrystals/Si-Nanocolumnar Structures by Conducting-Probe Atomic Force Microscopy Daichi TAKEUCHI Katsunori MAKIHARA Mitsuhisa IKEDA Seiichi MIYAZAKI Hirokazu KAKI Tsukasa HAYASHI
Publication: IEICE TRANSACTIONS on Electronics Publication Date: 2014/05/01 Vol. E97-C No. 5 ; pp. 397-400 Type of Manuscript: Special Section PAPER (Special Section on Fundamentals and Applications of Advanced Semiconductor Devices) Category: Keyword: Si nano-columnar structure, AFM, current image, electron emission,
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Characterization of Local Electronic Transport through Ultrathin Au/Highly-Dense Si Nanocolumnar Structures by Conducting-Probe Atomic Force Microscopy Daichi TAKEUCHI Katsunori MAKIHARA Mitsuhisa IKEDA Seiichi MIYAZAKI Hirokazu KAKI Tsukasa HAYASHI
Publication: IEICE TRANSACTIONS on Electronics Publication Date: 2013/05/01 Vol. E96-C No. 5 ; pp. 718-721 Type of Manuscript: Special Section PAPER (Special Section on Fundamentals and Applications of Advanced Semiconductor Devices) Category: Keyword: Si nanocolumnar structure, AFM, current image, electron emission,
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Study on Surface Characteristic of the Copper Nitride Films by Absorbed Oxygen Musun KWAK Jongho JEON Kyoungri KIM Yoonseon YI Sangjin AN Donsik CHOI Youngseok CHOI Kyongdeuk JEONG
Publication: IEICE TRANSACTIONS on Electronics Publication Date: 2012/11/01 Vol. E95-C No. 11 ; pp. 1744-1748 Type of Manuscript: INVITED PAPER (Special Section on Electronic Displays) Category: Keyword: copper nitride, weak boundary layer, oxygen, atmospheric pressure plasma, excimer ultraviolet, XPS, AFM,
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Fabrication and Device Simulation of Single Nano-Scale Organic Static Induction Transistors Noboru OHASHI Masakazu NAKAMURA Norio MURAISHI Masatoshi SAKAI Kazuhiro KUDO
Publication: IEICE TRANSACTIONS on Electronics Publication Date: 2006/12/01 Vol. E89-C No. 12 ; pp. 1765-1770 Type of Manuscript: Special Section PAPER (Special Section on Towards the Realization of Organic Molecular Electronics) Category: Organic Molecular Devices Keyword: organic SIT, nanostructures, AFM, colloidal lithography, semiconductor device simulation,
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Characterization of Germanium Nanocrystallites Grown on SiO₂ by a Conductive AFM Probe Technique Katsunori MAKIHARA Yoshihiro OKAMOTO Hideki MURAKAMI Seiichiro HIGASHI Seiichi MIYAZAKI
Publication: IEICE TRANSACTIONS on Electronics Publication Date: 2005/04/01 Vol. E88-C No. 4 ; pp. 705-708 Type of Manuscript: Special Section PAPER (Special Section on Fundamental and Application of Advanced Semiconductor Devices) Category: Nanomaterials and Quantum-Effect Devices Keyword: nanocrystal, AFM, conducting probe, local characterization,
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Alignment of Different Lengths of Carbon Nanotubes Using Low Applied Electric Field Khalil EL-HAMI Kazumi MATSUSHIGE
Publication: IEICE TRANSACTIONS on Electronics Publication Date: 2004/12/01 Vol. E87-C No. 12 ; pp. 2116-2118 Type of Manuscript: Special Section LETTER (Special Section on Recent Progress in Organic Molecular Electronics) Category: Fabrication of Organic Nano-devices Keyword: carbon nanotubes, alignment, flexibility, AFM,
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Nanoscale Investigation of Piezo and Leakage Defects in SBT Film by SPM Mami SAITO Kumi OKUWADA Soichi NADAHARA
Publication: IEICE TRANSACTIONS on Electronics Publication Date: 2001/06/01 Vol. E84-C No. 6 ; pp. 802-807 Type of Manuscript: Special Section PAPER (Special Issue on Nonvolatile Memories) Category: FeRAMs Keyword: AFM, piezo image, leakage current image, SrBi₂Ta₂O₉, sol-gel method,
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Wear Durability and Adhesion Evaluation Methods for Ultrathin Overcoat Films by Atomic Force Microscopy Shigeru UMEMURA Shigeru HIRONO Yasuko ANDOH Reizo KANEKO
Publication: IEICE TRANSACTIONS on Electronics Publication Date: 1998/03/25 Vol. E81-C No. 3 ; pp. 337-342 Type of Manuscript: Special Section PAPER (Special Issue on Electromechanical Devices and their Surface Science) Category: Keyword: wear, adhesion, thin film, microtribology, AFM,
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Stiffness of Measurement System and Significant Figures of Displacement which are Required to Interpret Adhesional Force Curves Kunio TAKAHASHI Nancy A. BURNHAM Hubert M. POLLOCK Tadao ONZAWA
Publication: IEICE TRANSACTIONS on Electronics Publication Date: 1997/02/25 Vol. E80-C No. 2 ; pp. 255-262 Type of Manuscript: Special Section PAPER (Special Issue on Micromachine Technology) Category: Actuator Keyword: force curve, AFM, Muller-Yushchenko-Derjaguin (MYD), Johnson-Kendall-Roberts (JKR), Derjaguin-Muller-Toporov (DMT), adhesion, elastic contact, stiffness, compliance,
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Evaluation of Si Surface Micro-Roughness by Measuring Chlorine Concentration and Total Charge of Native Oxide Ichiro OKI Tetsuo BIWA Jun KUDO Hikou SHIBAYAMA
Publication: IEICE TRANSACTIONS on Electronics Publication Date: 1992/07/25 Vol. E75-C No. 7 ; pp. 809-811 Type of Manuscript: Special Section PAPER (Special Issue on Ultra Clean Technology) Category: Keyword: AFM, STM, micro-roughness, HCl/H₂O₂,
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