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IEICE Trans

Shuhei KADOYAMA

Post-BIST Fault Diagnosis for Multiple Faults
Hiroshi TAKAHASHI Yoshinobu HIGAMI Shuhei KADOYAMA Yuzo TAKAMATSU Koji YAMAZAKI Takashi AIKYO Yasuo SATO 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 2008/03/01
Vol. E91-D  No. 3  pp. 771-775
Type of Manuscript:  Special Section LETTER (Special Section on Test and Verification of VLSIs)
Category: 
Keyword: 
post-BIST fault diagnosis, multiple stuck-at faults, combinational circuits, pass/fail information, 
 Summary | Full Text:PDF