Publication: IEICE TRANSACTIONS on Electronics
Publication Date: 2004/05/01
Vol. E87-C
No. 5
pp. 742-748
Type of Manuscript:
Special Section PAPER (Special Section on Advances in Characterization and Measurement Technologies for Microwave and Millimeter-Wave Materials, Devices and Circuits) Category: Active Devices and Circuits Keyword: on-wafer, noise figure measurement, low-noise amplifier, |