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IEICE Trans

Setsuo KANEKO

Back- and Front-Interface Trap Densities Evaluation and Stress Effect of Poly-Si TFT
Kenichi TAKATORI Hideki ASADA Setsuo KANEKO 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2008/10/01
Vol. E91-C  No. 10  pp. 1564-1569
Type of Manuscript:  INVITED PAPER (Special Section on Electronic Displays)
Category: 
Keyword: 
interface trap density, poly-Si TFT, stress effect, threshold-voltage method, 
 Summary | Full Text:PDF
FOREWORD
Setsuo KANEKO Kenji NAKAZAWA 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2003/11/01
Vol. E86-C  No. 11  pp. 2241-2242
Type of Manuscript:  FOREWORD
Category: 
Keyword: 
 Summary | Full Text:PDF
FOREWORD
Setsuo KANEKO 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2002/11/01
Vol. E85-C  No. 11  pp. 1837-1837
Type of Manuscript:  FOREWORD
Category: 
Keyword: 
 Summary | Full Text:PDF
LCD Legibility as a Function of Resolution
Takashi NOSE Naoyasu IKEDA Hiroshi KANOH Hidenori IKENO Hiroshi HAYAMA Setsuo KANEKO 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 1999/10/25
Vol. E82-C  No. 10  pp. 1792-1797
Type of Manuscript:  Special Section PAPER (Special Issue on Electronic Displays)
Category: 
Keyword: 
TFT-LCD, high resolution, legibility, subjective psychological experiments, 
 Summary | Full Text:PDF