Keyword : threshold-voltage method


Back- and Front-Interface Trap Densities Evaluation and Stress Effect of Poly-Si TFT
Kenichi TAKATORI Hideki ASADA Setsuo KANEKO 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2008/10/01
Vol. E91-C  No. 10 ; pp. 1564-1569
Type of Manuscript:  INVITED PAPER (Special Section on Electronic Displays)
Category: 
Keyword: 
interface trap densitypoly-Si TFTstress effectthreshold-voltage method
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