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IEICE Trans

Seichi OKAMURA

A Non-Reflection-Influence Method for On-Line Measurement of Permittivity Using Microwave Free-Space Technique
Zhihong MA Seichi OKAMURA 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 1998/12/25
Vol. E81-C  No. 12  pp. 1936-1941
Type of Manuscript:  PAPER
Category: Microwave and Millimeter Wave Technology
Keyword: 
microwave, permittivity, measurement, non-reflection, on-line, free-space technique, 
 Summary | Full Text:PDF
Analysis and Elimination of the Reflection lnfluence on Microwave Attenuation Measurement for Moisture Determination
Zhihong MA Seichi OKAMURA 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 1997/10/25
Vol. E80-C  No. 10  pp. 1324-1329
Type of Manuscript:  PAPER
Category: Microwave and Millimeter Wave Technology
Keyword: 
microwave, attenuation, reflection, moisture content, density, propagation distance, 
 Summary | Full Text:PDF