A Non-Reflection-Influence Method for On-Line Measurement of Permittivity Using Microwave Free-Space Technique

Zhihong MA  Seichi OKAMURA  

Publication
IEICE TRANSACTIONS on Electronics   Vol.E81-C   No.12   pp.1936-1941
Publication Date: 1998/12/25
Online ISSN: 
DOI: 
Print ISSN: 0916-8516
Type of Manuscript: PAPER
Category: Microwave and Millimeter Wave Technology
Keyword: 
microwave,  permittivity,  measurement,  non-reflection,  on-line,  free-space technique,  

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Summary: 
This paper describes a new method for permittivity measurement using microwave free-space technique. The general consideration is to measure the amplitudes of transmission and reflection coefficients and calculate the permittivity from the measurement values. Theoretical analysis shows that the permittivity of the sample can be calculated solely from the measurement values of the amplitudes of transmission and reflection coefficients when the sample is prepared with so large attenuation that the multiple reflections between the two surfaces of the sample can be neglected. Using this method, the permittivity measurement can be performed without reflection influence, and on-line measurement of the permittivity becomes possible because the permittivity can be measured instantaneously and without contact with the material.