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IEICE Trans

Ryoji YAJIMA

Initialize and Weak-Program Erasing Scheme for High-Performance and High-Reliability Ferroelectric NAND Flash Solid-State Drive
Kousuke MIYAJI Ryoji YAJIMA Teruyoshi HATANAKA Mitsue TAKAHASHI Shigeki SAKAI Ken TAKEUCHI 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2012/04/01
Vol. E95-C  No. 4  pp. 609-616
Type of Manuscript:  Special Section PAPER (Special Section on Solid-State Circuit Design – Architecture, Circuit, Device and Design Methodology)
Category: 
Keyword: 
ferroelectric FET, NAND flash memory, solid-state drive, bit-by-bit verifying technique, history effect, 
 Summary | Full Text:PDF