Keyword : history effect


SET-Tolerant Active Body-Bias Circuits in PD-SOI CMOS Technology
YoungKyu JANG Ik-Joon CHANG Jinsang KIM 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2015/07/01
Vol. E98-C  No. 7 ; pp. 729-733
Type of Manuscript:  PAPER
Category: Electronic Circuits
Keyword: 
active body biashistory effectPD-SOISET
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Initialize and Weak-Program Erasing Scheme for High-Performance and High-Reliability Ferroelectric NAND Flash Solid-State Drive
Kousuke MIYAJI Ryoji YAJIMA Teruyoshi HATANAKA Mitsue TAKAHASHI Shigeki SAKAI Ken TAKEUCHI 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2012/04/01
Vol. E95-C  No. 4 ; pp. 609-616
Type of Manuscript:  Special Section PAPER (Special Section on Solid-State Circuit Design – Architecture, Circuit, Device and Design Methodology)
Category: 
Keyword: 
ferroelectric FETNAND flash memorysolid-state drivebit-by-bit verifying techniquehistory effect
 Summary | Full Text:PDF