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IEICE Trans

Naoto YORINO

Prediction of DC-AC Converter Efficiency Degradation due to Device Aging Using a Compact MOSFET-Aging Model
Kenshiro SATO Dondee NAVARRO Shinya SEKIZAKI Yoshifumi ZOKA Naoto YORINO Hans Jürgen MATTAUSCH Mitiko MIURA-MATTAUSCH 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2020/03/01
Vol. E103-C  No. 3  pp. 119-126
Type of Manuscript:  PAPER
Category: Semiconductor Materials and Devices
Keyword: 
compact model, DC-AC converter, device aging, efficiency, SiC-MOSFET, 
 Summary | Full Text:PDF