Keyword : device aging


Prediction of DC-AC Converter Efficiency Degradation due to Device Aging Using a Compact MOSFET-Aging Model
Kenshiro SATO Dondee NAVARRO Shinya SEKIZAKI Yoshifumi ZOKA Naoto YORINO Hans Jürgen MATTAUSCH Mitiko MIURA-MATTAUSCH 
Publication:   
Publication Date: 2020/03/01
Vol. E103-C  No. 3 ; pp. 119-126
Type of Manuscript:  PAPER
Category: Semiconductor Materials and Devices
Keyword: 
compact modelDC-AC converterdevice agingefficiencySiC-MOSFET
 Summary | Full Text:PDF