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IEICE Trans

Nao UEDA

Performance Evaluation of Probing Front-End Circuits for On-Chip Noise Monitoring
Yuuki ARAGA Nao UEDA Yasumasa TAKAGI Makoto NAGATA 
Publication:   IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences
Publication Date: 2013/12/01
Vol. E96-A  No. 12  pp. 2516-2523
Type of Manuscript:  Special Section PAPER (Special Section on VLSI Design and CAD Algorithms)
Category: Device and Circuit Modeling and Analysis
Keyword: 
behavioral modeling, waveform data acquisition, power supply noise, substrate noise, diagnosis of VLSI circuits, 
 Summary | Full Text:PDF