Performance Evaluation of Probing Front-End Circuits for On-Chip Noise Monitoring

Yuuki ARAGA  Nao UEDA  Yasumasa TAKAGI  Makoto NAGATA  

Publication
IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences   Vol.E96-A   No.12   pp.2516-2523
Publication Date: 2013/12/01
Online ISSN: 1745-1337
DOI: 10.1587/transfun.E96.A.2516
Print ISSN: 0916-8508
Type of Manuscript: Special Section PAPER (Special Section on VLSI Design and CAD Algorithms)
Category: Device and Circuit Modeling and Analysis
Keyword: 
behavioral modeling,  waveform data acquisition,  power supply noise,  substrate noise,  diagnosis of VLSI circuits,  

Full Text: PDF>>
Buy this Article




Summary: 
A probing front end circuit (PFE) senses and digitizes voltage noises at in-circuit locations on such as power supply wiring and substrate taps in a chip, with the simplest circuit construction only with a source follower or a unity gain buffer, followed by a latch comparator. The PFE with 2.5V I/O transistors in a 65nm CMOS technology node demonstrates 9.0 ENOB and 60.7dB SFDR in equivalent sampling at 1.0Gs/s, for a sinusoidal waveform of 10MHz with 200mV peak-to-peak amplitude. Behavioral modeling of an entire waveform acquisition system using PFEs includes the statistical variations of reference voltage and sampling timing. The simulation quantitatively explains the measured dynamic properties of on-chip noise monitoring, such as the AC response in SNDR and digitizing throughputs, with the clear dependency on the frequency and amplitude of input waveforms.