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IEICE Trans

Mitsuya FUKAZAWA

Experimental Evaluation of Dynamic Power Supply Noise and Logical Failures in Microprocessor Operations
Mitsuya FUKAZAWA Masanori KURIMOTO Rei AKIYAMA Hidehiro TAKATA Makoto NAGATA 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2009/04/01
Vol. E92-C  No. 4  pp. 475-482
Type of Manuscript:  Special Section PAPER (Special Section on Low-Leakage, Low-Voltage, Low-Power and High-Speed Technologies for System LSIs in Deep-Submicron Era)
Category: 
Keyword: 
power supply voltage noise built-in probing circuit, failure susceptibility, dynamic frequency scaling, 
 Summary | Full Text:PDF
Measurement-Based Analysis of Delay Variation Induced by Dynamic Power Supply Noise
Mitsuya FUKAZAWA Makoto NAGATA 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2006/11/01
Vol. E89-C  No. 11  pp. 1559-1566
Type of Manuscript:  Special Section PAPER (Special Section on Novel Device Architectures and System Integration Technologies)
Category: 
Keyword: 
delay variation, dynamic power supply noise, static IR drop, on-chip waveform monitor circuit, signal integrity, 
 Summary | Full Text:PDF
An Integrated Timing and Dynamic Supply Noise Verification for Multi-10-Million Gate SoC Designs
Kenji SHIMAZAKI Makoto NAGATA Mitsuya FUKAZAWA Shingo MIYAHARA Masaaki HIRATA Kazuhiro SATOH Hiroyuki TSUJIKAWA 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2006/11/01
Vol. E89-C  No. 11  pp. 1535-1543
Type of Manuscript:  Special Section PAPER (Special Section on Novel Device Architectures and System Integration Technologies)
Category: 
Keyword: 
power-supply noise, ground noise, noise detector, dynamic IR drop, timing analysis, 
 Summary | Full Text:PDF