Keyword : static IR drop


Measurement-Based Analysis of Delay Variation Induced by Dynamic Power Supply Noise
Mitsuya FUKAZAWA Makoto NAGATA 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2006/11/01
Vol. E89-C  No. 11 ; pp. 1559-1566
Type of Manuscript:  Special Section PAPER (Special Section on Novel Device Architectures and System Integration Technologies)
Category: 
Keyword: 
delay variationdynamic power supply noisestatic IR dropon-chip waveform monitor circuitsignal integrity
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