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IEICE Trans

Linda MILOR

A Delay Evaluation Circuit for Analog BIST Function
Zhengliang LV Shiyuan YANG Hong WANG Linda MILOR 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2013/03/01
Vol. E96-C  No. 3  pp. 393-401
Type of Manuscript:  PAPER
Category: Semiconductor Materials and Devices
Keyword: 
delay testing, BIST, analog filter, sample-hold circuit, 
 Summary | Full Text:PDF