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An Improved EEHEMT RF Noise Model for 0.25 µm InGaP pHEMT Transistor Using Verilog-A Language
An-Sam PENG Lin-Kun WU | Publication: IEICE TRANSACTIONS on Electronics
Publication Date: 2017/05/01
Vol. E100-C
No. 5
pp. 424-429
Type of Manuscript:
Special Section PAPER (Special Section on Fundamentals and Applications of Advanced Semiconductor Devices)
Category:
Keyword:
pHEMT, noise parameters, modeling, EEHEMT, | | | Summary | Full Text:PDF | |
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A Flexible Microwave De-Embedding Method for On-Wafer Noise Parameter Characterization of MOSFETs
Yueh-Hua WANG Ming-Hsiang CHO Lin-Kun WU | Publication: IEICE TRANSACTIONS on Electronics
Publication Date: 2009/09/01
Vol. E92-C
No. 9
pp. 1157-1162
Type of Manuscript:
Special Section PAPER (Special Section on Recent Progress in Microwave and Millimeter-Wave Technologies and Their Applications)
Category:
Keyword:
de-embedding, microwave, MOSFETs, noise, RF, silicon, | | | Summary | Full Text:PDF | |
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