Lin-Kun WU


An Improved EEHEMT RF Noise Model for 0.25 µm InGaP pHEMT Transistor Using Verilog-A Language
An-Sam PENG Lin-Kun WU 
Publication:   
Publication Date: 2017/05/01
Vol. E100-C  No. 5  pp. 424-429
Type of Manuscript:  Special Section PAPER (Special Section on Fundamentals and Applications of Advanced Semiconductor Devices)
Category: 
Keyword: 
pHEMTnoise parametersmodelingEEHEMT
 Summary | Full Text:PDF

Through-Silicon-Via Characterization and Modeling Using a Novel One-Port De-Embedding Technique
An-Sam PENG Ming-Hsiang CHO Yueh-Hua WANG Meng-Fang WANG David CHEN Lin-Kun WU 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2013/10/01
Vol. E96-C  No. 10  pp. 1289-1293
Type of Manuscript:  Special Section PAPER (Special Section on Emerging Technologies and Applications for Microwave and Millimeter-Wave Systems)
Category: 
Keyword: 
3D ICTSVde-embeddingTEGsmicrowaveRF modeling
 Summary | Full Text:PDF

A Flexible Microwave De-Embedding Method for On-Wafer Noise Parameter Characterization of MOSFETs
Yueh-Hua WANG Ming-Hsiang CHO Lin-Kun WU 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2009/09/01
Vol. E92-C  No. 9  pp. 1157-1162
Type of Manuscript:  Special Section PAPER (Special Section on Recent Progress in Microwave and Millimeter-Wave Technologies and Their Applications)
Category: 
Keyword: 
de-embeddingmicrowaveMOSFETsnoiseRFsilicon
 Summary | Full Text:PDF

Scalable Short-Open-Interconnect S-Parameter De-Embedding Method for On-Wafer Microwave Characterization of Silicon MOSFETs
Ming-Hsiang CHO Yueh-Hua WANG Lin-Kun WU 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2007/09/01
Vol. E90-C  No. 9  pp. 1708-1714
Type of Manuscript:  Special Section PAPER (Special Section on Microwave and Millimeter-Wave Technology)
Category: Active Devices/Circuits
Keyword: 
calibrationde-embeddingCMOSmicrowaveparasiticsS-parameters
 Summary | Full Text:PDF