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IEICE Trans

Ken-ichiro SONODA

Circuit-Level Electrothermal Simulation of Electrostatic Discharge in Integrated Circuits
Ken-ichiro SONODA Motoaki TANIZAWA Kiyoshi ISHIKAWA Norihiko KOTANI Tadashi NISHIMURA 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2000/08/25
Vol. E83-C  No. 8  pp. 1317-1323
Type of Manuscript:  Special Section PAPER (Special Issue on 1999 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD'99))
Category: Circuit Applications
Keyword: 
electrostatic discharge, electrothermal simulation, circuit simulation, 
 Summary | Full Text:PDF
Nonlocal Impact Ionization Model and Its Application to Substrate Current Simulation of n-MOSFET's
Ken-ichiro SONODA Mitsuru YAMAJI Kenji TANIGUCHI Chihiro HAMAGUCHI Tatsuya KUNIKIYO 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 1995/03/25
Vol. E78-C  No. 3  pp. 274-280
Type of Manuscript:  Special Section PAPER (Special Issue on Sub-1/4 Micron Device and Process Technologies)
Category: 
Keyword: 
nonlocal impact ionization, substrate current, Monte Carlo simulation, device simulation, drift-diffusion model, 
 Summary | Full Text:PDF
Soft-Error Study of DRAMs with Retrograde Well Structure by New Evaluation Method
Yoshikazu OHNO Hiroshi KIMURA Ken-ichiro SONODA Tadashi NISHIMURA Shin-ichi SATOH Hirokazu SAYAMA Shigenori HARA Mikio TAKAI Hirokazu MIYOSHI 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 1994/03/25
Vol. E77-C  No. 3  pp. 399-405
Type of Manuscript:  Special Section PAPER (Special Issue on Quarter Micron Si Device and Process Technologies)
Category: Device Technology
Keyword: 
soft-error, DRAM, microprobe, proton, mapping, 
 Summary | Full Text:PDF