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IEICE Trans

Keisuke OGURA

Programming and Program-Verification Methods for Low-Voltage Flash Memories Using a Sector Programming Scheme
Katsutaka KIMURA Toshihiro TANAKA Masataka KATO Tetsuo ADACHI Keisuke OGURA Hitoshi KUME 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 1995/07/25
Vol. E78-C  No. 7  pp. 832-837
Type of Manuscript:  Special Section PAPER (Special Issue on LSI Memory Device, Circuit, Architecture and Application Technologies for Multimedia Age)
Category: 
Keyword: 
flash memory, program, erase, Fowler-Nordheim tunneling, sector, 
 Summary | Full Text:PDF