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IEICE Trans

Keisuke KAWAMURA

AlGaN/GaN HEMT on 3C-SiC/Low-Resistivity Si Substrate for Microwave Applications
Akio WAKEJIMA Arijit BOSE Debaleen BISWAS Shigeomi HISHIKI Sumito OUCHI Koichi KITAHARA Keisuke KAWAMURA 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2022/10/01
Vol. E105-C  No. 10  pp. 457-465
Type of Manuscript:  INVITED PAPER (Special Section on Microwave and Millimeter-Wave Technologies)
Category: 
Keyword: 
AlGaN/GaN, high electron mobility transistor (HEMT), GaN-on-Si, 3C-SiC intermediate layer, microwave amplifier, 
 Summary | Full Text:PDF
Evaluation of Fixed Charge and Interface Trap Densities in SIMOX Wafers and Their Effects on Device Characteristics
Shoichi MASUI Tatsuo NAKAJIMA Keisuke KAWAMURA Takayuki YANO Isao HAMAGUCHI Masaharu TACHIMORI 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 1995/09/25
Vol. E78-C  No. 9  pp. 1263-1272
Type of Manuscript:  PAPER
Category: Integrated Electronics
Keyword: 
SOI, fixed oxide charge, interface trap, parasitic capacitance, subthreshold slope, 
 Summary | Full Text:PDF