Publication: IEICE TRANSACTIONS on Electronics
Publication Date: 2009/05/01
Vol. E92-C
No. 5
pp. 639-646
Type of Manuscript:
Special Section PAPER (Special Section on Fundamentals and Applications of Advanced Semiconductor Devices)
Category:
Keyword:
testing, diagnosis, coupling faults, stuck-at faults March test algorithm, built-in self-test (BIST), built-in self-diagnosis (BISD), automated march-based test algorithm, SRAM, |