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IEICE Trans

Incheol KIM

Built-In Self-Test for Static ADC Testing with a Triangle-Wave
Incheol KIM Ingeol LEE Sungho KANG 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2013/02/01
Vol. E96-C  No. 2  pp. 292-294
Type of Manuscript:  BRIEF PAPER
Category: Integrated Electronics
Keyword: 
ADC, BIST, static test, triangle-wave, 
 Summary | Full Text:PDF
Noise-Tolerant DAC BIST Scheme Using Integral Calculus Approach
Hyeonuk SON Incheol KIM Sang-Goog LEE Jin-Ho AHN Jeong-Do KIM Sungho KANG 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2011/08/01
Vol. E94-C  No. 8  pp. 1344-1347
Type of Manuscript:  LETTER
Category: Electronic Circuits
Keyword: 
digital-to-analogue converter (DAC), built-in self-test (BIST), noise-immunity, static testing, 
 Summary | Full Text:PDF
A New Built-in Self Test Scheme for Phase-Locked Loops Using Internal Digital Signals
Youbean KIM Kicheol KIM Incheol KIM Sungho KANG 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2008/10/01
Vol. E91-C  No. 10  pp. 1713-1716
Type of Manuscript:  LETTER
Category: Integrated Electronics
Keyword: 
mixed-signal test, PLL (phase-locked loops), BIST (built-in self test), DFT (design for testability), 
 Summary | Full Text:PDF
A Low-Cost BIST Based on Histogram Testing for Analog to Digital Converters
Kicheol KIM Youbean KIM Incheol KIM Hyeonuk SON Sungho KANG 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2008/04/01
Vol. E91-C  No. 4  pp. 670-672
Type of Manuscript:  LETTER
Category: Semiconductor Materials and Devices
Keyword: 
ADC testing, BIST, histogram testing, 
 Summary | Full Text:PDF
A New Scan Power Reduction Scheme Using Transition Freezing for Pseudo-Random Logic BIST
Youbean KIM Kicheol KIM Incheol KIM Hyunwook SON Sungho KANG 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 2008/04/01
Vol. E91-D  No. 4  pp. 1185-1188
Type of Manuscript:  LETTER
Category: Computer Components
Keyword: 
low power BIST (Built-in Self Test), pseudo-random BIST, low power pattern generator, 
 Summary | Full Text:PDF
A New Analog-to-Digital Converter BIST Considering a Transient Zone
Incheol KIM Kicheol KIM Youbean KIM HyeonUk SON Sungho KANG 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2007/11/01
Vol. E90-C  No. 11  pp. 2161-2163
Type of Manuscript:  LETTER
Category: Integrated Electronics
Keyword: 
static ADC built-in self-test, transient zone problem, 
 Summary | Full Text:PDF
A New Low Power Test Pattern Generator for BIST Architecture
Kicheol KIM Dongsub SONG Incheol KIM Sungho KANG 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2005/10/01
Vol. E88-C  No. 10  pp. 2037-2038
Type of Manuscript:  LETTER
Category: Semiconductor Materials and Devices
Keyword: 
low power BIST, low power test pattern generator, 
 Summary | Full Text:PDF