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IEICE Trans

Hun Woo KYE

Estimation of Imprint Failure Lifetime in FeRAM with Pt/SrBi2Ta2O9/Pt Capacitor
Young Min KANG Seaung Suk LEE Beelyong YANG Choong Heui CHUNG Hun Woo KYE Suk Kyoung HONG Nam Soo KANG 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2001/06/01
Vol. E84-C  No. 6  pp. 757-762
Type of Manuscript:  Special Section PAPER (Special Issue on Nonvolatile Memories)
Category: FeRAMs
Keyword: 
ferroelectric, nonvolatile, memory, FeRAM, imprint, reliability, 
 Summary | Full Text:PDF