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IEICE Trans

Hong-Sun HWANG

An Area-Efficient, Low-VDD, Highly Reliable Multi-Cell Antifuse System Fully Operative in DRAMs
Jong-Pil SON Jin Ho KIM Woo Song AHN Seung Uk HAN Satoru YAMADA Byung-Sick MOON Churoo PARK Hong-Sun HWANG Seong-Jin JANG Joo Sun CHOI Young-Hyun JUN Soo-Won KIM 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2011/10/01
Vol. E94-C  No. 10  pp. 1690-1697
Type of Manuscript:  PAPER
Category: Integrated Electronics
Keyword: 
DRAM, antifuse, repair, post-package repair, recovery, 
 Summary | Full Text:PDF