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IEICE Trans

Hong-Ming SHIEH

A Multi-Code Compression Scheme for Test Time Reduction of System-on-Chip Designs
Hong-Ming SHIEH Jin-Fu LI 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 2008/10/01
Vol. E91-D  No. 10  pp. 2428-2434
Type of Manuscript:  PAPER
Category: Dependable Computing
Keyword: 
system-on-chip, test, compression, multi-code compression, decompression, 
 Summary | Full Text:PDF