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IEICE Trans

Chia-Yi LIN

On Reducing Test Power, Volume and Routing Cost by Chain Reordering and Test Compression Techniques
Chia-Yi LIN Li-Chung HSU Hung-Ming CHEN 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2010/03/01
Vol. E93-C  No. 3  pp. 369-378
Type of Manuscript:  Special Section PAPER (Special Section on Circuits and Design Techniques for Advanced Large Scale Integration)
Category: 
Keyword: 
DFT, TSP, test power, 
 Summary | Full Text:PDF