Publication: IEICE TRANSACTIONS on Electronics
Publication Date: 2014/06/01
Vol. E97-C
No. 6
pp. 538-545
Type of Manuscript:
Special Section PAPER (Special Section on Analog Circuits and Related SoC Integration Technologies) Category: Keyword: analog-to-digital converter (ADC), design for testability (DFT), pattern generator (PG), output response analyzer (ORA), |