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A Low-Cost Stimulus Design for Linearity Test in SAR ADCs
An-Sheng CHAO Cheng-Wu LIN Hsin-Wen TING Soon-Jyh CHANG
IEICE TRANSACTIONS on Electronics
Publication Date: 2014/06/01
Online ISSN: 1745-1353
Type of Manuscript: Special Section PAPER (Special Section on Analog Circuits and Related SoC Integration Technologies)
analog-to-digital converter (ADC), design for testability (DFT), pattern generator (PG), output response analyzer (ORA),
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The proposed stimulus design for linearity test is embedded in a differential successive approximation register analog-to-digital converter (SAR ADC), i.e. a design for testability (DFT). The proposed DFT is compatible to the pattern generator (PG) and output response analyzer (ORA) with the cost of 12.4-% area of the SAR ADC. The 10-bit SAR ADC prototype is verified in a 0.18-µm CMOS technology and the measured differential nonlinearity (DNL) error is between -0.386 and 0.281 LSB at 1-MS/s.