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Vol.E70-E No.4
pp.336-338 Special SectionLETTER
Components and Materials Effect of Annealing on Electrical Conductivity of Sintered Silicon Carbide Kazuo OKANO, |
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Vol.E70-E No.4
pp.339-342 Special SectionLETTER
Components and Materials Contact Voltage Emerging in Fretting Contacts Mating Dissimilar Metals Masao TSUBOI, Takeo MARUYAMA, |
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Vol.E70-E No.4
pp.343-345 Special SectionLETTER
Components and Materials Ellipsometric Analysis for Growth of Contaminant Films on Contact Surface Terutaka TAMAI, Mitsuo KOMINAMI, |
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Vol.E70-E No.4
pp.346-348 Special SectionLETTER
Components and Materials Nonaqueous Secondary Batteries Using Poly(3-methylthiophene) as the Cathode-Active Material Takao NAGATOMO, Mitsuyuki MITSUI, Kazuhiro MATSUTANI, Osamu OMOTO, |
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Vol.E70-E No.4
pp.349-351 Special SectionLETTER
Instrumentation and Electronic Circuits Contact-Free Detection of Current Fluctuation--Multi-Carrier Configuration-- Sumihisa HASHIGUCHI, Naofumi HOSHI, |
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Vol.E70-E No.4
pp.352-354 Special SectionLETTER
Instrumentation and Electronic Circuits Improvement of the Method for Measuring Glossiness of Curved Surfaces Using CCD Line Sensor Teizo AIDA, Satoru HAYASAKI, Seizi MIZUTANI, Yutaka SAKAUE, Hideo KUGISAWA, |
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Vol.E70-E No.4
pp.355-357 Special SectionLETTER
Instrumentation and Electronic Circuits A Method for Estimating Discontact Rate from Pantograph Noise Currenct by Using Statistical Test Koji YAMASHITA, Osamu FUJIWARA, Kazuo KATOH, Takashi AZAKAMI, |
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Vol.E70-E No.4
pp.358-359 Special SectionLETTER
Instrumentation and Electronic Circuits A Method for Visualizing 2-Dimensional Distribution of Electrostatic Charge Takeshi KONDOH, Osamu FUJIWARA, Kazuo KATOH, Takashi AZAKAMI, |
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Vol.E70-E No.4
pp.360-363 Special SectionLETTER
Instrumentation and Electronic Circuits Domain Attribute Identification Using Only Run Parameters Toru TAKEDA, |
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Vol.E70-E No.4
pp.364-366 Special SectionLETTER
Instrumentation and Electronic Circuits COMOS Overtone Crystal Osciliator Circuit Masahiro TOKI, Shinichi HATTORI, |
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Current List: 42781 - 42790
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