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Total 43996 documents match your query. Current List: 42431 - 42440

Vol.E71-E No.11  pp.1089-1090
LETTER  Quantum Electronics
Room Temperature CW Operation of GaAs Vertical Cavity Surface Emitting Laser
Fumio KOYAMASusumu KINOSHITAKenichi IGA
Summary | Full Text:PDF

Vol.E71-E No.11  pp.1091-1094
LETTER  Computer Hardware and Design
On the Usefulness of Additional Vias in Multilayer Printed Wiring Boards
Mohsen GHAMESHLUNoriyoshi YOSHIDA
Summary | Full Text:PDF

Vol.E71-E No.11  pp.1095-1097
LETTER  Image Processing, Computer Graphics and Pattern Recognition
A Fast DCT-SQ Scheme for Images
Yukihiro ARAITakeshi AGUIMasayuki NAKAJIMA
Summary | Full Text:PDF

Vol.E71-E No.11  pp.1098-1106
PAPER  General and Electrical Acoustics
A Computer-Aided Identification Method of Arbitrary Stochastic System Contaminated by Modelling Errors and Background Noises
Mitsuo OHTAKazutatsu HATAKEYAMAKiminobu NISHIMURA
Summary | Full Text:PDF

Vol.E71-E No.11  pp.1107-1115
PAPER  Digital Signal Processing
Design of FIR Partial Response Filter with Equiripple Stopband Attenuation (Class )
Ake CHAISAWADITsuoshi TAKEBEToyoji MATSUMOTOKiyoshi NISHIKAWA
Summary | Full Text:PDF

Vol.E71-E No.11  pp.1116-1121
PAPER  Information Theory and Coding Theory
A New Look into Fano's Inequality from the Viewpoint of the Rate-Risk Function
Fumio KANAYA
Summary | Full Text:PDF

Vol.E71-E No.11  pp.1122-1126
PAPER  Communication Cable and Wave Guides
Exact Determination of Electro-Optic Constants of Single-Mode Proton-Exchanged Guiding Layers
Yukiko KONDOLi HUYoichi FUJII
Summary | Full Text:PDF

Vol.E71-E No.11  pp.1127-1133
PAPER  Integrated Electronics
High Speed Tunnel Current Measurement (HSTCM) through Insulators and Its Application to Non-volatile Memory Devices
Toru KAGATakaaki HAGIWARA
Summary | Full Text:PDF

Vol.E71-E No.11  pp.1134-1139
PAPER  Automaton, Language and Theory of Computing
Equational Dataflow Programs Computing Logic Programs
Susumu YAMASAKI
Summary | Full Text:PDF

Vol.E71-E No.11  pp.1140-1145
PAPER  Software Systems
An Optimal Release Problem Based on a Testing-Effort Dependent Software Reliability Model
Hiroshi OHTERAShigeru YAMADAHiroyuki NARIHISA
Summary | Full Text:PDF

Current List: 42431 - 42440
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