Warning: Undefined array key "abst" in /var/www/02search_html/bin/keyword.php on line 56

Warning: Undefined array key "abst" in /var/www/02search_html/bin/keyword.php on line 192

Warning: Undefined array key "abst" in /var/www/02search_html/bin/keyword.php on line 192

Warning: Undefined array key "abst" in /var/www/02search_html/bin/keyword.php on line 192

Warning: Undefined array key "abst" in /var/www/02search_html/bin/keyword.php on line 202

Warning: Undefined array key "abst" in /var/www/02search_html/bin/keyword.php on line 271

Warning: Undefined array key "abst" in /var/www/02search_html/bin/keyword.php on line 271

Warning: Undefined array key "abst" in /var/www/02search_html/bin/keyword.php on line 271

Warning: Undefined array key "abst" in /var/www/02search_html/bin/keyword.php on line 271

Warning: Undefined array key "abst" in /var/www/02search_html/bin/keyword.php on line 296

Warning: Undefined array key "abst" in /var/www/02search_html/bin/keyword.php on line 315
IEICE Trans

Keyword : variable-length time frames

Improved Forward Test Generation of Sequential Circuits Using Variable-Length Time Frames
Yuzo TAKAMATSU Taijiro OGAWA Hiroshi TAKAHASHI 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 1993/07/25
Vol. E76-D  No. 7 ; pp. 832-836
Type of Manuscript:  Special Section LETTER (Special Issue on VLSI Testing and Testable Design)
Category: 
Keyword: 
forward test generation, sequential circuits, variable-length time frames, state escaping, 
 Summary | Full Text:PDF