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IEICE Trans

Keyword : unknown state

X-Tolerant Test Data Compression for SOC with Enhanced Diagnosis Capability
Gang ZENG Hideo ITO 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 2005/07/01
Vol. E88-D  No. 7 ; pp. 1662-1670
Type of Manuscript:  PAPER
Category: Dependable Computing
Keyword: 
SOC testing, test cost reduction, test data compression, unknown state, test diagnosis, 
 Summary | Full Text:PDF