Warning: Undefined array key "abst" in /var/www/02search_html/bin/keyword.php on line 56

Warning: Undefined array key "abst" in /var/www/02search_html/bin/keyword.php on line 192

Warning: Undefined array key "abst" in /var/www/02search_html/bin/keyword.php on line 192

Warning: Undefined array key "abst" in /var/www/02search_html/bin/keyword.php on line 192

Warning: Undefined array key "abst" in /var/www/02search_html/bin/keyword.php on line 192

Warning: Undefined array key "abst" in /var/www/02search_html/bin/keyword.php on line 192

Warning: Undefined array key "abst" in /var/www/02search_html/bin/keyword.php on line 202

Warning: Undefined array key "abst" in /var/www/02search_html/bin/keyword.php on line 271

Warning: Undefined array key "abst" in /var/www/02search_html/bin/keyword.php on line 271

Warning: Undefined array key "abst" in /var/www/02search_html/bin/keyword.php on line 271

Warning: Undefined array key "abst" in /var/www/02search_html/bin/keyword.php on line 271

Warning: Undefined array key "abst" in /var/www/02search_html/bin/keyword.php on line 296

Warning: Undefined array key "abst" in /var/www/02search_html/bin/keyword.php on line 315
IEICE Trans

Keyword : transistor short

Fault Simulation and Test Generation for Transistor Shorts Using Stuck-at Test Tools
Yoshinobu HIGAMI Kewal K. SALUJA Hiroshi TAKAHASHI Shin-ya KOBAYASHI Yuzo TAKAMATSU 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 2008/03/01
Vol. E91-D  No. 3 ; pp. 690-699
Type of Manuscript:  Special Section PAPER (Special Section on Test and Verification of VLSIs)
Category: Defect-Based Testing
Keyword: 
transistor short, fault simulation, test generation, stuck-at test tool, 
 Summary | Full Text:PDF