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IEICE Trans

Keyword : totally self-checking

Formal Verification of Totally Self-Checking Properties of Combinational Circuits
Kazuo KAWAKUBO Koji TANAKA Hiromi HIRAISHI 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 1997/01/25
Vol. E80-D  No. 1 ; pp. 57-62
Type of Manuscript:  Special Section PAPER (Special Issue on Fault-Tolerant Computing)
Category: Verification
Keyword: 
formal verification, totally self-checking, fault tolerance, binary decision diagram, 
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