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IEICE Trans

Keyword : threshold testing and error tolerance

A Practical Threshold Test Generation for Error Tolerant Application
Hideyuki ICHIHARA Kenta SUTOH Yuki YOSHIKAWA Tomoo INOUE 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 2010/10/01
Vol. E93-D  No. 10 ; pp. 2776-2782
Type of Manuscript:  PAPER
Category: Information Network
Keyword: 
acceptable fault, test generation model, error significance, threshold testing and error tolerance, 
 Summary | Full Text:PDF